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江蘇天瑞儀器股份有限公司生產光譜、色譜、質譜等分析測試儀器及其軟件的研發、生產和銷售的一體型企業。公司于2011年1月25日在深圳創業板上市,成為分析測試儀器行業的一家上市公司。天瑞儀器是具有RoHS環保測試儀|RoHS2.0檢測儀|鄰苯測試儀|XRF|鹵素儀|重金屬測試儀|XRF|金屬鍍層測厚儀|金鎳厚測試儀|金屬元素分析儀|便攜式測試儀|天瑞EDX1800B|天瑞鍍層膜厚儀|天瑞EDX1800E|天瑞rohs測試天瑞ROHS有害元素分析儀|ROHS無鹵元素分析儀|氣相色譜|相色譜|子吸收光譜|X射線熒光光譜儀|光電直讀光譜儀|ICP光譜儀|金屬多元素分析儀|碳硫分析儀|X熒光測厚儀ROHS儀器、無鹵分析儀、REACH分析儀、增塑劑檢測儀等儀器的生產銷售,
汽車ELV檢測儀移動樣品平臺
電制冷Si-PIN探測器
信號檢測電子電路
高低壓電源
大功率X光管
計算機及噴墨打印機
汽車ELV檢測儀產品特點
快速:一般測量一個樣品只需要1~3分鐘
無損:物理測量,不改變樣品性質
直觀:直觀的分析譜圖,元素分布一幕了然
環保:檢測過程中不產生任何廢氣、廢水
汽車ELV檢測儀是一款集鹵素指令、RoHS指令、重金屬指令于一體的X熒光光譜儀。對鉛、汞、鎘、鋇等元素有很好的檢測下限以及精度。X熒光光譜儀根據各元素的特征X射線的強度,可以測定元素含量。近年來,X熒光光譜分析在各行業應用范圍不斷拓展,已成為一種廣泛應用于冶金、地質、有色、建材、商檢、環保、衛生等各個域,特別是在RoHS檢測域應用得多也廣泛。大多數分析元素均可用其進行分析,可分析固體、粉末、熔珠、液體等樣品,分析范圍為Be到U。并且具有分析速度快、測量范圍寬、干擾小的特點。
針對EDX1800ROHS含鉛量檢測儀在各個域的廣泛應用,根據優化產品性能和提高安全防護等的需求,特別設計該款EDX1800B。應用新一代的高壓電源和X光管,提高產品的可靠性;利用新X光管的大功率提高儀器的測試效率。
ROHS含鉛量檢測儀移動樣品平臺
電制冷Si-PIN探測器
信號檢測電子電路
高低壓電源
大功率X光管
計算機及噴墨打印機
ROHS含鉛量檢測儀元素分析范圍從硫(S)到鈾(U)
分析檢出限可達1ppm
分析含量一般為1ppm到99.99%
任意多個可選擇的分析和識別模型
相互立的基體效應校正模型
多變量非線性回歸程序
溫度適應范圍為15℃至30℃
電源:交流220V±5V,建議配置交流凈化穩壓電源
能量分辨率:160±5eV
外觀尺寸: 550×416×333mm
樣品腔尺寸:460×298×98mm
重量:45Kg
Skyray Analytical Testing Instrument Research Institute has three centers, namely "analysis instrument research and development center", "physiochemical analysis and testing center" and "analysis and testing technology application development center."Tianrui Analytical Instruments Co., Ltd. recently formed a staff of 1 academician, 11 Ph.D., 13 senior engineers, 17 masters, and 50 undergraduate R&D personnel from famous universities.
Mr. Liu Zhaogui: graduate student in nuclear physics from Tsinghua University. It has been appraised as the outstanding entrepreneur of Jiangsu Province, the young and middle-aged experts who have outstanding contribution in Jiangsu Province, the first science and Technology Minister of Kunshan, and the national science and technology ministry "scientific and technological innovation and entrepreneurial talent". With the approval of the State Council, the special allowance of the State Council is enjoyed.
Dr. Yao graduated from the Department of Engineering Physics of Tsinghua University with a Ph.D. in nuclear electronics. He has been engaged in the development of analytical instruments for 26 years. He is mainly engaged in the research of X-ray fluorescence analysis technology and application technology, and he participated in the "Thirteenth Five-Year Plan" national key instrument technology research and development. Patent of "Spectrometer Grating 2D" patent, "X-ray fluorescence double crystal fixed element track spectrometer" patent and "X-ray fluorescence spectrum analyzer pyrolytic graphite crystal beam splitter" patent, and participated in the drafting of a number of national standards industry The standard is an authoritative expert in the X-ray fluorescence spectrometer industry in China.
The FP (Basic Parameters) algorithm is an effective method for X-ray fluorescence spectrometry analysis. It can perform qualitative and quantitative analysis of the elemental components of the sample with little or no standard sample, and can also analyze the thickness of the coating or coating.It is well known that the biggest problem with X-ray fluorescence analysis is that elemental fluorescence intensity is affected by coexisting elements (matrix absorption and enhancement effects) and is not usually linear with content. The basic parameter method has already taken into account the matrix effect in the calculation of the spectrum, and the linear relationship between the calculated content and the known content can be obtained. Using a few known sample calibration algorithms to eliminate systematic errors can achieve accurate quantitative results.
The polarization secondary target excitation technology can remove the scattering background to the maximum extent, improve the signal to noise ratio, and reduce the detection limit of the detector. Assuming that the x-ray generated by the anode of the x-ray tube is non-polarized and is incident on the target (scattering body) in the z-axis direction, the scattered beam propagating along the y-axis is linearly polarized light. The electric field vector vibrates in the v plane and the vibration direction is parallel to the X axis. The sample placed on the y-axis is excited by polarized light, producing unpolarized fluorescent x-rays. Since the sample and the sample support do not generate scattered radiation in the X-axis direction, placing the detector on the x-axis can fully utilize the polarization effect and reduce the background caused by the elastic and inelastic scattering of x-rays.
From the X-ray generator to the sample, the X-ray fluorescence emitted by the sample to the detector is called the light path. The shorter the distance traveled by the optical path is, the less interference will be caused. Skyray Instrument designed an ultra-short optical path technology to ensure the accuracy of light element detection results, and is particularly suitable for RoHS-compliant halogen-free instruction detection.
The micro-level positioning, micro-scanning analysis, the point-to-point centering of the spatial micro-sized spot and the determination of the spatial micro-focus spot position have been truly achieved. A translation and rotation switching position device realizes position rotation switching in a small space, avoids the large space required for the linear motion and the common rotation movement, because the problem of lengthening of the optical path caused by the inability to fit is eliminated.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
Skyray's unique SNR enhancement technology can effectively remove noise signal interference and minimize element detection limits.
As shown in Figure SUPER XRF 1050, the determination of Pb in food can be as low as 0.59 ppm.
patented intelligent analysis software enables precise analysis of 80 elements, non-standard quantitative analysis, micro-analysis, thin film analysis, and advanced sub-spectral analysis.
hotline:800-9993-818
TEL:86 136 1622 3382
Address: 1888 Zhonghuayuan West Road, Kunshan City, Jiangsu Province/
深圳寶安區松崗芙蓉東路桃花源科技創新園22層