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4月15日——16日， 2018年第十二屆中國科學儀器發展年會(ACCSI 2018)在常州召開。作為年會的“重頭戲”，ACCSI 2018“儀器及檢測風云榜頒獎盛典”依然備受矚目。千余業內精英齊聚典禮現場，共同見證了科學儀器行業各項“重量級”獎項的誕生。天瑞儀器應邀出席，并摘得“2017科學儀器行業最具影響力廠商”及“2017科學儀器行業最受關注儀器”2項大獎。
“最具影響力廠商”由儀器信息網發起的“2017年度科學儀器行業最具影響力廠商”評選活動篩選產生。該活動是從儀器信息網的千余家參展商中，根據廠商2017年度的中國產值、在儀器信息網的年度獨立訪問人數、在用戶中的關注度等作為主要評選維度，經過綜合評分計算，最終確定天瑞儀器入圍。該獎項的獲得，是對天瑞儀器2017年整體成績的肯定，也是對天瑞儀器繼續前行繼續奮斗的激勵。
“科學儀器行業最受關注儀器獎”自評選以來，已成功舉行過10屆，作為儀器信息網重要產品獎項之一，該獎項評選旨在表彰當年度受用戶關注最高的儀器。本次評選涉及20個儀器類別，共計吸引了150余家公司200余臺儀器參與其中。天瑞儀器Genius XRF手持式X熒光分析儀突破重圍，成功當選。
近年來，天瑞在Genius XRF 基礎上，結合10多年便攜XRF技術研發經驗，集中了光電子、微電子、半導體和計算機等多項技術，具有自主知識產權的全新一代手持XRF產品——Explorer XRF系列?？蓮V泛應用于有害元素分析（EXPLORER 3000）、合金分析（EXPLORER 5000）、礦石成分分析（EXPLORER 7000）以及土壤重金屬分析（EXPLORER 9000）等眾多領域的快速便捷檢驗。
Skyray Analytical Testing Instrument Research Institute has three centers, namely "analysis instrument research and development center", "physiochemical analysis and testing center" and "analysis and testing technology application development center."Tianrui Analytical Instruments Co., Ltd. recently formed a staff of 1 academician, 11 Ph.D., 13 senior engineers, 17 masters, and 50 undergraduate R&D personnel from famous universities.
Mr. Liu Zhaogui: graduate student in nuclear physics from Tsinghua University. It has been appraised as the outstanding entrepreneur of Jiangsu Province, the young and middle-aged experts who have outstanding contribution in Jiangsu Province, the first science and Technology Minister of Kunshan, and the national science and technology ministry "scientific and technological innovation and entrepreneurial talent". With the approval of the State Council, the special allowance of the State Council is enjoyed.
Dr. Yao graduated from the Department of Engineering Physics of Tsinghua University with a Ph.D. in nuclear electronics. He has been engaged in the development of analytical instruments for 26 years. He is mainly engaged in the research of X-ray fluorescence analysis technology and application technology, and he participated in the "Thirteenth Five-Year Plan" national key instrument technology research and development. Patent of "Spectrometer Grating 2D" patent, "X-ray fluorescence double crystal fixed element track spectrometer" patent and "X-ray fluorescence spectrum analyzer pyrolytic graphite crystal beam splitter" patent, and participated in the drafting of a number of national standards industry The standard is an authoritative expert in the X-ray fluorescence spectrometer industry in China.
The FP (Basic Parameters) algorithm is an effective method for X-ray fluorescence spectrometry analysis. It can perform qualitative and quantitative analysis of the elemental components of the sample with little or no standard sample, and can also analyze the thickness of the coating or coating.It is well known that the biggest problem with X-ray fluorescence analysis is that elemental fluorescence intensity is affected by coexisting elements (matrix absorption and enhancement effects) and is not usually linear with content. The basic parameter method has already taken into account the matrix effect in the calculation of the spectrum, and the linear relationship between the calculated content and the known content can be obtained. Using a few known sample calibration algorithms to eliminate systematic errors can achieve accurate quantitative results.
The polarization secondary target excitation technology can remove the scattering background to the maximum extent, improve the signal to noise ratio, and reduce the detection limit of the detector. Assuming that the x-ray generated by the anode of the x-ray tube is non-polarized and is incident on the target (scattering body) in the z-axis direction, the scattered beam propagating along the y-axis is linearly polarized light. The electric field vector vibrates in the v plane and the vibration direction is parallel to the X axis. The sample placed on the y-axis is excited by polarized light, producing unpolarized fluorescent x-rays. Since the sample and the sample support do not generate scattered radiation in the X-axis direction, placing the detector on the x-axis can fully utilize the polarization effect and reduce the background caused by the elastic and inelastic scattering of x-rays.
From the X-ray generator to the sample, the X-ray fluorescence emitted by the sample to the detector is called the light path. The shorter the distance traveled by the optical path is, the less interference will be caused. Skyray Instrument designed an ultra-short optical path technology to ensure the accuracy of light element detection results, and is particularly suitable for RoHS-compliant halogen-free instruction detection.
The micro-level positioning, micro-scanning analysis, the point-to-point centering of the spatial micro-sized spot and the determination of the spatial micro-focus spot position have been truly achieved. A translation and rotation switching position device realizes position rotation switching in a small space, avoids the large space required for the linear motion and the common rotation movement, because the problem of lengthening of the optical path caused by the inability to fit is eliminated.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
XRF test and analysis instruments are generally used for the comparison test of standard samples, which are subject to the quality of the standard samples during the test. Tianrui Instrument's original non-standard technology can carry out all-element analysis without standard samples, leading the development trend and trend of the industry.
Skyray's unique SNR enhancement technology can effectively remove noise signal interference and minimize element detection limits.
As shown in Figure SUPER XRF 1050, the determination of Pb in food can be as low as 0.59 ppm.
patented intelligent analysis software enables precise analysis of 80 elements, non-standard quantitative analysis, micro-analysis, thin film analysis, and advanced sub-spectral analysis.
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